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International Conference on Spectroscopic Ellipsometry- ICSE-2, (Charleston, SC, USA, 12-15 May 1997), 2 Abstracts: P2.15 and P4.12; Proceedings of the 21st International Conference on Microelectronics, Yugoslavia, 15-17 September, Vol. 1, p.111-114, 1997; Infos97-Insulation Films on Semiconductors, June 11-14, Stenungsund, Sweden, P13, 1997; The 29th IEEE Photovoltaic Specialists Conference.-(20-24 May 2002, New Orleans, USA), Proceedings, p. 1178-1181;

(28.08-2.09.2005, Bremen, Germany),

Abstract

Th-P-072; The 14th International Symposium on Nanostructures Physics and Technology, (26-30.06.2006, St. Petersburg, Russia), Abstract, p. 82-83;

The 28th International Conference on the Physics of Semiconductors, (24-28 July, 2006, Vienna, Austria) Abstract FrM2j.31; Symposium on Growth of III-Nitrides, (Linkoping, Sweden, 2006) Abstract; The 4th International Conference on Spectroscopic Ellipsometry- ICSE-4, (Stockholm, Sweden, June 11-15, 2007), 3 Abstracts: p. 28, p.81, p. 290; MRS spring meeting 2008, (San Francisco CA, USA), Abstract H4.42; The 5th International Conference on Spectroscopic Ellipsometry- ICSE-5, (Albany NY USA, 23-28 May, 2010) 4 Abstracts; The 18th International Symposium Nanostructures: Physics and Technology (St. Petersburg, Russia, June 21-26, 2010) Abstract, SCORPH-2010 VIII 1 oral presentation; 7th International Conference on Nanosciences & Nanotechnologies (NN10), oral presentation, 11-14 July 2010, Ouranoupolis Halkidiki, Greece, p.58; 2 Posters on 2nd International Conference on OEEM 2012, China, Shanghai, p. 95 and p. 127;. oral presentation on EMRS 2012 FALL MEETING, September 17-21, Poland, Program K-XI 3; oral presentation on The First International Conference Development of nanotechnologies Barnaul, 2012, Proceedings p.

124-126.



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